How the BEX technique is changing the way we use SEM

Register for our upcoming webinar, and discover all about Unity, the world's first BackScatter Electron and X-ray (BEX) imaging detector for Scanning Electron Microscope (SEM). BEX is a revolutionary imaging technique that simultaneously combines BackScattered Electron and X-ray signals to deliver rapid high-definition colour images, embedded with elemental data from your sample. Not only does Unity allow effortless navigation around the sample while providing full chemical detail of its surface makeup, It enables rapid, accurate, high-definition chemical mapping of the entire sample in minutes.

Join us to learn more about BEX and see how the Unity detector will revolutionise analysis in scanning electron microscopy using a variety of sample types to show the power of this new technology in action.

You will learn:

Basics of the BEX technique and the Unity detector
Examples of how BEX is used to solve real issues in Battery, Geology, Alloys and Electronics
How BEX can be used in extreme conditions like variable pressure mode and high magnifications